Performance testing of a novel off-plane reflection grating and silicon pore optic spectrograph at PANTER

Hannah Marlowe, Randall L. McEntaffer, Ryan Allured, Casey DeRoo, Drew M. Miles, Benjamin D. Donovan, James H. Tutt, Vadim Burwitz, Benedikt Menz, Gisela D. Hartner, Randall K. Smith, Ramses Günther, Alex Yanson, Giuseppe Vacanti, Marcelo Ackermann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

An X-ray spectrograph consisting of aligned, radially ruled off-plane reflection gratings and silicon pore optics (SPO) was tested at the Max Planck Institute for extraterrestrial Physics PANTER X-ray test facility. The SPO is a test module for the proposed Arcus mission, which will also feature aligned off-plane reflection gratings. This test is the first time two off-plane gratings were actively aligned to each other and with a SPO to produce an overlapped spectrum. We report the performance of the complete spectrograph utilizing the aligned gratings module and plans for future development.

Original languageEnglish (US)
Title of host publicationEUV and X-Ray Optics
Subtitle of host publicationSynergy Between Laboratory and Space IV
EditorsRene Hudec, Rene Hudec, Ladislav Pina, Ladislav Pina
PublisherSPIE
ISBN (Electronic)9781628416312, 9781628416312
DOIs
StatePublished - Jan 1 2015
EventEUV and X-Ray Optics: Synergy Between Laboratory and Space IV - Prague, Czech Republic
Duration: Apr 13 2015Apr 14 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9510
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherEUV and X-Ray Optics: Synergy Between Laboratory and Space IV
CountryCzech Republic
CityPrague
Period4/13/154/14/15

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Performance testing of a novel off-plane reflection grating and silicon pore optic spectrograph at PANTER'. Together they form a unique fingerprint.

  • Cite this

    Marlowe, H., McEntaffer, R. L., Allured, R., DeRoo, C., Miles, D. M., Donovan, B. D., Tutt, J. H., Burwitz, V., Menz, B., Hartner, G. D., Smith, R. K., Günther, R., Yanson, A., Vacanti, G., & Ackermann, M. (2015). Performance testing of a novel off-plane reflection grating and silicon pore optic spectrograph at PANTER. In R. Hudec, R. Hudec, L. Pina, & L. Pina (Eds.), EUV and X-Ray Optics: Synergy Between Laboratory and Space IV [95100O] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9510). SPIE. https://doi.org/10.1117/12.2185693