Periodic domain inversion in Z-cut LiTaO3 by electron beam scanning assisted by an internal field within the crystal

Venkatraman Gopalan, Alan C. Nutt, Mool C. Gupta

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

The coercive field for domain reversal in a 0.5 mm Z-cut LiTaO 3 was measured to be 21 KV/mm. However, if the polarization of the crystal is reversed using an electric field of 21 KV/mm, the coercive field for a second reversal is found to be 11 KV/mm. This asymmetry is due to the presence of an in-built internal field of 5 KV/mm in the virgin crystal. If the electron beam writing is done on the new C-face of the polarization reversed region of the crystal, (1) no cracking was observed, (2) the writing required less charge for domain inversion because of the reduced coercive field, thereby facilitating shorter scan times. We have obtained uniform 3.6 μm period domain inversion grating using this technique.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsMool C. Gupta, William J. Kozlovsky, David C. MacPherson
Pages196-202
Number of pages7
StatePublished - Jan 1 1996
EventNonlinear Frequency Generation and Conversion - San Jose, CA, USA
Duration: Jan 29 1996Jan 31 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2700

Other

OtherNonlinear Frequency Generation and Conversion
CitySan Jose, CA, USA
Period1/29/961/31/96

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Gopalan, V., Nutt, A. C., & Gupta, M. C. (1996). Periodic domain inversion in Z-cut LiTaO3 by electron beam scanning assisted by an internal field within the crystal. In M. C. Gupta, W. J. Kozlovsky, & D. C. MacPherson (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 196-202). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2700).