Phase-separation-induced surface patterns in thin polymer blend films

A. Karim, T. M. Slawecki, S. K. Kumar, J. F. Douglas, S. K. Satija, C. C. Han, T. P. Russell, Y. Liu, R. Overney, J. Sokolov, M. H. Rafailovich

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Abstract

Atomic force microscopy (AFM), neutron reflection (NR) and secondary ion mass spectroscopy (SIMS) are used to examine phase separation in symmetrically segregating thin polymer blend films (≤1000 Å). Phase separation in the film leads to undulations of the liquid-air interface, provided the film is sufficiently thin to suppress surface-directed spinodal decomposition waves. Flattened droplets are formed at a very late stage of phase separation, and the aspect ratio of these droplets can be rationalized by an interfacial free energy minimization argument.

Original languageEnglish (US)
Pages (from-to)857-862
Number of pages6
JournalMacromolecules
Volume31
Issue number3
DOIs
StatePublished - Feb 10 1998

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All Science Journal Classification (ASJC) codes

  • Organic Chemistry
  • Polymers and Plastics
  • Inorganic Chemistry
  • Materials Chemistry

Cite this

Karim, A., Slawecki, T. M., Kumar, S. K., Douglas, J. F., Satija, S. K., Han, C. C., Russell, T. P., Liu, Y., Overney, R., Sokolov, J., & Rafailovich, M. H. (1998). Phase-separation-induced surface patterns in thin polymer blend films. Macromolecules, 31(3), 857-862. https://doi.org/10.1021/ma970687g