TY - JOUR
T1 - Photovoltaic measurements
AU - Ashok, S
AU - Pande, K. P.
PY - 1985/1/1
Y1 - 1985/1/1
N2 - In this article the commonly used techniques for measurement and evaluation of solar cell devices and materials are reviewed. Topics covered include determination of the solar cell performance parameters under simulated solar illumination, the electrical characteristics to obtain internal device parameters, the spectral response and quantum efficiency, the minority carrier lifetime and diffusion length, and the surface recombination velocity. The merits and limitations of the techniques are also discussed.
AB - In this article the commonly used techniques for measurement and evaluation of solar cell devices and materials are reviewed. Topics covered include determination of the solar cell performance parameters under simulated solar illumination, the electrical characteristics to obtain internal device parameters, the spectral response and quantum efficiency, the minority carrier lifetime and diffusion length, and the surface recombination velocity. The merits and limitations of the techniques are also discussed.
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U2 - 10.1016/0379-6787(85)90007-9
DO - 10.1016/0379-6787(85)90007-9
M3 - Article
AN - SCOPUS:0022044519
VL - 14
SP - 61
EP - 81
JO - Solar Energy Materials and Solar Cells
JF - Solar Energy Materials and Solar Cells
SN - 0927-0248
IS - 1
ER -