Abstract
In this article the commonly used techniques for measurement and evaluation of solar cell devices and materials are reviewed. Topics covered include determination of the solar cell performance parameters under simulated solar illumination, the electrical characteristics to obtain internal device parameters, the spectral response and quantum efficiency, the minority carrier lifetime and diffusion length, and the surface recombination velocity. The merits and limitations of the techniques are also discussed.
Original language | English (US) |
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Pages (from-to) | 61-81 |
Number of pages | 21 |
Journal | Solar Cells |
Volume | 14 |
Issue number | 1 |
DOIs | |
State | Published - Jan 1 1985 |
All Science Journal Classification (ASJC) codes
- Engineering(all)