Physical Adsorption of Multilayer Films on Planar Substrates and inside Cylindrical Pores

E. Cheng, M. W. Cole

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

We summarize and extend our previous study of multilayer film adsorption on planar surfaces. The density profile of the adsorbed film is studied by a mean-field approximation. This leads to a self-consistent potential and a correction in thickness prediction to the result of Lifshitz and co-workers. The correction is determined by the van der Waals interaction and film compressibility and is found to be important for He films. A simple model is presented also for the physisorption isotherm inside a cylindrical pore. Comparisons with experimental data are provided.

Original languageEnglish (US)
Pages (from-to)616-625
Number of pages10
JournalLangmuir
Volume5
Issue number3
DOIs
StatePublished - May 1 1989

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry

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