TY - JOUR
T1 - Piezoelectric films for MEMS applications
AU - Trolier-McKinstry, S.
N1 - Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2001/5
Y1 - 2001/5
N2 - Piezoelectric thin films are attractive for applications in MicroElectroMechanical Systems (MEMS) due to the combination of high energy density and low power requirements relative to other on-chip actuation mechanisms. As such, they can be utilized for applications as diverse as the pumping systems in miniature analytical instrumentation, high sensitivity accelerometers and hydrophones, miniature motors, and high frequency biomedical ultrasound, for example. Critical in all of these applications is the magnitude of the electromechanical response that can be generated. This paper will focus on the factors which affect the measured piezoelectric response of ferroelectric thin films. Particular emphasis will be placed on the effects of substrate clamping, clamping of the extrinsic contributions to the properties, and the role of preferred polarization directions in increasing the long-term reliability of ferroelectric films for piezoelectric applications.
AB - Piezoelectric thin films are attractive for applications in MicroElectroMechanical Systems (MEMS) due to the combination of high energy density and low power requirements relative to other on-chip actuation mechanisms. As such, they can be utilized for applications as diverse as the pumping systems in miniature analytical instrumentation, high sensitivity accelerometers and hydrophones, miniature motors, and high frequency biomedical ultrasound, for example. Critical in all of these applications is the magnitude of the electromechanical response that can be generated. This paper will focus on the factors which affect the measured piezoelectric response of ferroelectric thin films. Particular emphasis will be placed on the effects of substrate clamping, clamping of the extrinsic contributions to the properties, and the role of preferred polarization directions in increasing the long-term reliability of ferroelectric films for piezoelectric applications.
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U2 - 10.2109/jcersj.109.1269_s76
DO - 10.2109/jcersj.109.1269_s76
M3 - Article
AN - SCOPUS:0035333107
VL - 109
SP - S76-S79
JO - Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi/Journal of the Ceramic Society of Japan
JF - Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi/Journal of the Ceramic Society of Japan
SN - 1882-0743
IS - 1269
ER -