Polarization fatigue in Pb(In0.5Nb0.5)O3-Pb(Mg1/3Nb 2/3)O3-PbTiO3 single crystals

Shujun Zhang, Jun Luo, Fei Li, Richard J. Meyer, Wesley Hackenberger, Thomas R. Shrout

Research output: Contribution to journalArticlepeer-review

41 Scopus citations

Abstract

Electric fatigue tests have been conducted on pure and manganese-modified Pb(In0.5Nb0.5)O3-Pb(Mg1/3Nb 2/3)O3-PbTiO3 (PIN-PMN-PT) single crystals along different crystallographic directions. Polarization degradation was observed to suddenly occur above 50-100 bipolar cycles in 〈1 1 0〉 oriented samples, while 〈0 0 1〉 oriented samples exhibited almost fatigue free characteristics. The fatigue behavior was investigated as a function of orientation, magnitude of the electric field and manganese dopant. It was found that 〈0 0 1〉 oriented PIN-PMN-PT crystals were fatigue free, due to its small domain size, being on the order of 1 μm. The 〈1 1 0〉 direction exhibited a strong electrical fatigue behavior due to mechanical degradation. Micro/macro cracks developed in fatigued 〈1 1 0〉 oriented single crystals. Fatigue and cracks were the result of strong anisotropic piezoelectric stress and non-180° domain switching, which completely locked the non-180° domains. Furthermore, manganese-modified PIN-PMN-PT crystals were found to show improved fatigue behavior due to an enhanced coercive field.

Original languageEnglish (US)
Pages (from-to)3773-3780
Number of pages8
JournalActa Materialia
Volume58
Issue number10
DOIs
StatePublished - Jun 2010

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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