Polarization sensitivity testing of off-plane reflection gratings

Hannah Marlowe, Randall Lee McEntaffer, Casey T. DeRoo, Drew M. Miles, James Henry Tutt, Christian Laubis, Victor Soltwisch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Off-Plane reflection gratings were previously predicted to have different efficiencies when the incident light is polarized in the transverse-magnetic (TM) versus transverse-electric (TE) orientations with respect to the grating grooves. However, more recent theoretical calculations which rigorously account for finitely conducting, rather than perfectly conducting, grating materials no longer predict significant polarization sensitivity. We present the first empirical results for radially ruled, laminar groove profile gratings in the off-plane mount which demonstrate no difference in TM versus TE efficiency across our entire 300-1500 eV bandpass. These measurements together with the recent theoretical results confirm that grazing incidence off-plane reflection gratings using real, not perfectly conducting, materials are not polarization sensitive.

Original languageEnglish (US)
Title of host publicationOptics for EUV, X-Ray, and Gamma-Ray Astronomy VII
EditorsGiovanni Pareschi, Stephen L. O'Dell, Giovanni Pareschi, Stephen L. O'Dell
PublisherSPIE
ISBN (Electronic)9781628417692, 9781628417692
DOIs
StatePublished - Jan 1 2015
EventOptics for EUV, X-Ray, and Gamma-Ray Astronomy VII - San Diego, United States
Duration: Aug 10 2015Aug 13 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9603
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptics for EUV, X-Ray, and Gamma-Ray Astronomy VII
CountryUnited States
CitySan Diego
Period8/10/158/13/15

All Science Journal Classification (ASJC) codes

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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  • Cite this

    Marlowe, H., McEntaffer, R. L., DeRoo, C. T., Miles, D. M., Tutt, J. H., Laubis, C., & Soltwisch, V. (2015). Polarization sensitivity testing of off-plane reflection gratings. In G. Pareschi, S. L. O'Dell, G. Pareschi, & S. L. O'Dell (Eds.), Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII [960318] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9603). SPIE. https://doi.org/10.1117/12.2186344