Polycrystalline silicon optical fibers with atomically smooth surfaces

Noel Healy, Laura Lagonigro, Justin R. Sparks, Stuart Boden, Pier J.A. Sazio, John V. Badding, Anna C. Peacock

Research output: Contribution to journalArticle

21 Scopus citations

Abstract

We investigate the surface roughness of polycrystalline silicon core optical fibers fabricated using a high-pressure chemical deposition technique. By measuring the optical transmission of two fibers with different core sizes, we will show that scattering from the corëCcladding interface has a negligible effect on the losses. A Zemetrics ZeScope three-dimensional optical profiler has been used to directly measure the surface of the core material, confirming a roughness of only ∼0:1nm. The ability to fabricate low-loss polysilicon optical fibers with ultrasmooth cores scalable to submicrometer dimensions should establish their use in a range of nonlinear optical applications.

Original languageEnglish (US)
Pages (from-to)2480-2482
Number of pages3
JournalOptics Letters
Volume36
Issue number13
DOIs
StatePublished - Jul 1 2011

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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    Healy, N., Lagonigro, L., Sparks, J. R., Boden, S., Sazio, P. J. A., Badding, J. V., & Peacock, A. C. (2011). Polycrystalline silicon optical fibers with atomically smooth surfaces. Optics Letters, 36(13), 2480-2482. https://doi.org/10.1364/OL.36.002480