Polymethylmethacrylate by XPS

Scott W. Rosencrance, Wayne K. Way, Nicholas Winograd, David A. Shirley

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

X ray photoelectron spectroscopy was used to analyze a thin film of polymethylmethacrylate (PMMA) which was spin cast from a 2% weight solution of PMMA in toluene onto a gold substrate. A Hewlett Packard 5950A ESCA spectrometer was used for this investigation.

Original languageEnglish (US)
Pages (from-to)71-75
Number of pages5
JournalSurface Science Spectra
Volume2
Issue number1
DOIs
StatePublished - Jan 1993

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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