Polynomial Time Testability of Circuits Generated by Input Decomposition

Gueesang Lee, Mary Jane Irwin, Robert Michael Owens

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Polynomial time testability of combinational circuits generated by input decomposition, especially those generated by the logic synthesis tool FACTOR, is considered. First, the complexity of the fault detection problem in this class of circuits is explored using a stuck-at fault model. An O(2K m) algorithm for detecting a single stuck-at fault is given that is faster than the O(16K m), previously reported best algorithm proposed by Fujiwara, where K is the number of inputs in a subcircuit and m the number of signal lines in the circuit. Efficient, polynomial time algorithms are described for generating a test set for all single stuck-at faults in the circuit. The basic strategy is to eliminate backtracks during line. justification by constructing tables or vector sets in each subcircuit, which makes the fault propagation procedure very simple and eventually results in an efficient test generation procedure. This presentation of efficient polynomial time test generation algorithms for FACTOR-generated circuits is important, since it shows that it is possible to synthesize circuits that are optimized for area and are polynomial time testable at the same time.

Original languageEnglish (US)
Pages (from-to)201-210
Number of pages10
JournalIEEE Transactions on Computers
Volume43
Issue number2
DOIs
StatePublished - Feb 1994

Fingerprint

Polynomial time
Polynomials
Decomposition
Decompose
Networks (circuits)
Fault
Test Generation
Combinatorial circuits
Logic Synthesis
Fault detection
Line
Fault Detection
Test Set
Justification
Polynomial-time Algorithm
Tables
Eliminate
Propagation

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics

Cite this

Lee, Gueesang ; Irwin, Mary Jane ; Owens, Robert Michael. / Polynomial Time Testability of Circuits Generated by Input Decomposition. In: IEEE Transactions on Computers. 1994 ; Vol. 43, No. 2. pp. 201-210.
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Polynomial Time Testability of Circuits Generated by Input Decomposition. / Lee, Gueesang; Irwin, Mary Jane; Owens, Robert Michael.

In: IEEE Transactions on Computers, Vol. 43, No. 2, 02.1994, p. 201-210.

Research output: Contribution to journalArticle

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