Potential imaging of pentacene organic thin-film transistors was studied. An atomic force microscopy (AFM) was operated with a conductive tip in noncontact mode in scanning Kelvin probe microscopy (SKPM). The potential measured at the source and drain contacts was approximately constant with small variations related to the surface potential of the pentacene film.
|Original language||English (US)|
|Number of pages||3|
|Journal||Applied Physics Letters|
|State||Published - Sep 22 2003|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)