Practical implications of instrument displacement drift during force-controlled nanoindentation

A. L. Romasco, L. H. Friedman, L. Fang, R. A. Meirom, Trevor Edward Clark, R. Polcawich, J. Pulskamp, M. Dubey, C. L. Muhlstein

Research output: Contribution to journalArticle

Abstract

The accuracy of instrumented indentation data relies heavily on the evaluation of experimental errors such as displacement drift. In spite of its importance, little attention has been given to the magnitude of an acceptable displacement drift rate, its relationship to a given set of test conditions, and how errors manifest themselves in force-displacement data. In this work we explored how drift rates that were acceptable for short-term tests caused artificial "abnormal" behavior that could have been interpreted as a true material response for a longer-term test. A critical review of the drift behavior of the nanoindentation system revealed that a useful metric for screening data quality was the nominal accumulated system drift as a fraction of the maximum penetration depth. Additionally, suggestions for drift management during nanoindentation tests were given.

Original languageEnglish (US)
JournalJournal of Testing and Evaluation
Volume38
Issue number2
DOIs
StatePublished - Mar 1 2010

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Nanoindentation
Indentation
Screening

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Romasco, A. L. ; Friedman, L. H. ; Fang, L. ; Meirom, R. A. ; Clark, Trevor Edward ; Polcawich, R. ; Pulskamp, J. ; Dubey, M. ; Muhlstein, C. L. / Practical implications of instrument displacement drift during force-controlled nanoindentation. In: Journal of Testing and Evaluation. 2010 ; Vol. 38, No. 2.
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Romasco, AL, Friedman, LH, Fang, L, Meirom, RA, Clark, TE, Polcawich, R, Pulskamp, J, Dubey, M & Muhlstein, CL 2010, 'Practical implications of instrument displacement drift during force-controlled nanoindentation', Journal of Testing and Evaluation, vol. 38, no. 2. https://doi.org/10.1520/JTE102177

Practical implications of instrument displacement drift during force-controlled nanoindentation. / Romasco, A. L.; Friedman, L. H.; Fang, L.; Meirom, R. A.; Clark, Trevor Edward; Polcawich, R.; Pulskamp, J.; Dubey, M.; Muhlstein, C. L.

In: Journal of Testing and Evaluation, Vol. 38, No. 2, 01.03.2010.

Research output: Contribution to journalArticle

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