Practitioners' challenges panel: The challenges and opportunities of forensic investigation over large data sets - Timeliness vs precision vs comprehensiveness

Nan Zhang, Yong Guan, Michael M. Losavio, Peter Vasquez, Robert M. Nissen, Edward Talbot, Vassil Roussev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication2011 6th IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2011
DOIs
StatePublished - Dec 1 2011
Event2011 6th IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2011 - Berkeley/Oakland, CA, United States
Duration: May 26 2011May 26 2011

Publication series

Name2011 6th IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2011

Other

Other2011 6th IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2011
CountryUnited States
CityBerkeley/Oakland, CA
Period5/26/115/26/11

All Science Journal Classification (ASJC) codes

  • Information Systems and Management

Cite this

Zhang, N., Guan, Y., Losavio, M. M., Vasquez, P., Nissen, R. M., Talbot, E., & Roussev, V. (2011). Practitioners' challenges panel: The challenges and opportunities of forensic investigation over large data sets - Timeliness vs precision vs comprehensiveness. In 2011 6th IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2011 [6159121] (2011 6th IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2011). https://doi.org/10.1109/SADFE.2011.13