PbZrO3(PZ) thin films crystallization by rapid thermal annealing (RTA) was studied using Raman-scattering spectroscopy, and the results were compared with those of x-ray diffraction(XRD) result. It was found to be strongly affected the kinetics of subsequent amorphous-perovskite crystallization by RTA temperature. The use of such post anneals allowed to make films of reproducible microstructure and texture [ both (221) and (240)] prepared by RTA. The low frequency (<200 cm-1) Raman peaks for the PZ film disappear and three new Raman peaks occur at the 83 cm-1, 138 cm-1, 273 cm-1 respectively.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics