Probabilistic robustness: An RLC circuit realization of the truncation phenomenon

J. Zhang, C. M. Lagoa, B. R. Barmish

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Scopus citations


    A recently developed new paradigm for probabilistic robustness analysis does not require apriori information about the underlying distribution function for the uncertain parameters; only a mild monotonicity and symmetry assumption is involved. The starting point is exactly the same as in classical robustness theory - a system with uncertain parameters which are only known within given bounds. However, instead of calculating the classical robustness margin for such a system, a risk-adjusted margin is sought. The theory suggests that the "best" way to sample the uncertain parameters is not necessarily the most intuitive way. That is, the sampling distribution to use is not something obvious such as a normal or uniform distribution. The main objective of this paper is to demonstrate that these "counterintuitive" predictions of the theory are not just mathematical possibilities but actually admit physical realizations.

    Original languageEnglish (US)
    Title of host publicationProceedings of the 1998 American Control Conference, ACC 1998
    Number of pages2
    StatePublished - 1998
    Event1998 American Control Conference, ACC 1998 - Philadelphia, PA, United States
    Duration: Jun 24 1998Jun 26 1998

    Publication series

    NameProceedings of the American Control Conference
    ISSN (Print)0743-1619


    Other1998 American Control Conference, ACC 1998
    Country/TerritoryUnited States
    CityPhiladelphia, PA

    All Science Journal Classification (ASJC) codes

    • Electrical and Electronic Engineering


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