Probabilistic robustness

An RLC circuit realization of the truncation phenomenon

J. Zhang, Constantino Manuel Lagoa, B. R. Barmish

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)

    Abstract

    A recently developed new paradigm for probabilistic robustness analysis does not require apriori information about the underlying distribution function for the uncertain parameters; only a mild monotonicity and symmetry assumption is involved. The starting point is exactly the same as in classical robustness theory - a system with uncertain parameters which are only known within given bounds. However, instead of calculating the classical robustness margin for such a system, a risk-adjusted margin is sought. The theory suggests that the "best" way to sample the uncertain parameters is not necessarily the most intuitive way. That is, the sampling distribution to use is not something obvious such as a normal or uniform distribution. The main objective of this paper is to demonstrate that these "counterintuitive" predictions of the theory are not just mathematical possibilities but actually admit physical realizations.

    Original languageEnglish (US)
    Title of host publicationProceedings of the 1998 American Control Conference, ACC 1998
    Pages1427-1428
    Number of pages2
    DOIs
    StatePublished - Dec 1 1998
    Event1998 American Control Conference, ACC 1998 - Philadelphia, PA, United States
    Duration: Jun 24 1998Jun 26 1998

    Publication series

    NameProceedings of the American Control Conference
    Volume3
    ISSN (Print)0743-1619

    Other

    Other1998 American Control Conference, ACC 1998
    CountryUnited States
    CityPhiladelphia, PA
    Period6/24/986/26/98

    Fingerprint

    Distribution functions
    Sampling
    Networks (circuits)

    All Science Journal Classification (ASJC) codes

    • Electrical and Electronic Engineering

    Cite this

    Zhang, J., Lagoa, C. M., & Barmish, B. R. (1998). Probabilistic robustness: An RLC circuit realization of the truncation phenomenon. In Proceedings of the 1998 American Control Conference, ACC 1998 (pp. 1427-1428). [707060] (Proceedings of the American Control Conference; Vol. 3). https://doi.org/10.1109/ACC.1998.707060
    Zhang, J. ; Lagoa, Constantino Manuel ; Barmish, B. R. / Probabilistic robustness : An RLC circuit realization of the truncation phenomenon. Proceedings of the 1998 American Control Conference, ACC 1998. 1998. pp. 1427-1428 (Proceedings of the American Control Conference).
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    Zhang, J, Lagoa, CM & Barmish, BR 1998, Probabilistic robustness: An RLC circuit realization of the truncation phenomenon. in Proceedings of the 1998 American Control Conference, ACC 1998., 707060, Proceedings of the American Control Conference, vol. 3, pp. 1427-1428, 1998 American Control Conference, ACC 1998, Philadelphia, PA, United States, 6/24/98. https://doi.org/10.1109/ACC.1998.707060

    Probabilistic robustness : An RLC circuit realization of the truncation phenomenon. / Zhang, J.; Lagoa, Constantino Manuel; Barmish, B. R.

    Proceedings of the 1998 American Control Conference, ACC 1998. 1998. p. 1427-1428 707060 (Proceedings of the American Control Conference; Vol. 3).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

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    Zhang J, Lagoa CM, Barmish BR. Probabilistic robustness: An RLC circuit realization of the truncation phenomenon. In Proceedings of the 1998 American Control Conference, ACC 1998. 1998. p. 1427-1428. 707060. (Proceedings of the American Control Conference). https://doi.org/10.1109/ACC.1998.707060