Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

Q. M. Ramasse, Nasim Alem, O. V. Yazyev, A. Zettl, C. T. Pan, R. R. Nair, R. Jalil, R. Zan, U. Bangert, C. R. Seabourne, A. J. Scott, K. S. Novoselov

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1526-1527
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
StatePublished - Jan 1 2012

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Boron nitride
Electron energy loss spectroscopy
boron nitrides
Electronic structure
Impurities
electronic structure
impurities
Defects
defects

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Ramasse, Q. M. ; Alem, Nasim ; Yazyev, O. V. ; Zettl, A. ; Pan, C. T. ; Nair, R. R. ; Jalil, R. ; Zan, R. ; Bangert, U. ; Seabourne, C. R. ; Scott, A. J. ; Novoselov, K. S. / Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS. In: Microscopy and Microanalysis. 2012 ; Vol. 18, No. S2. pp. 1526-1527.
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title = "Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS",
author = "Ramasse, {Q. M.} and Nasim Alem and Yazyev, {O. V.} and A. Zettl and Pan, {C. T.} and Nair, {R. R.} and R. Jalil and R. Zan and U. Bangert and Seabourne, {C. R.} and Scott, {A. J.} and Novoselov, {K. S.}",
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Ramasse, QM, Alem, N, Yazyev, OV, Zettl, A, Pan, CT, Nair, RR, Jalil, R, Zan, R, Bangert, U, Seabourne, CR, Scott, AJ & Novoselov, KS 2012, 'Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS', Microscopy and Microanalysis, vol. 18, no. S2, pp. 1526-1527. https://doi.org/10.1017/S1431927612009488

Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS. / Ramasse, Q. M.; Alem, Nasim; Yazyev, O. V.; Zettl, A.; Pan, C. T.; Nair, R. R.; Jalil, R.; Zan, R.; Bangert, U.; Seabourne, C. R.; Scott, A. J.; Novoselov, K. S.

In: Microscopy and Microanalysis, Vol. 18, No. S2, 01.01.2012, p. 1526-1527.

Research output: Contribution to journalArticle

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AU - Ramasse, Q. M.

AU - Alem, Nasim

AU - Yazyev, O. V.

AU - Zettl, A.

AU - Pan, C. T.

AU - Nair, R. R.

AU - Jalil, R.

AU - Zan, R.

AU - Bangert, U.

AU - Seabourne, C. R.

AU - Scott, A. J.

AU - Novoselov, K. S.

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EP - 1527

JO - Microscopy and Microanalysis

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