Probing domain microstructure in ferroelectric Bi4Ti3O12 thin films by optical second harmonic generation

Yaniv Barad, James Lettieri, Chris D. Theis, Darrell G. Schlom, Venkatraman Gopalan, J. C. Jiang, X. Q. Pan

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The domain microstructure in an epitaxial thin film of Bi4Ti3O12 on a SrTiO3(001) substrate is studied by second harmonic generation measurements. The input polarization dependence of the second harmonic signal exhibits spatial symmetries that reflect the presence of eight different domain variants present in the film. A theoretical model is presented that explains the observed symmetries and extracts quantitative information on the nonlinear optical coefficients of the material and statistics of domain variants present in the film area being probed. The following ratios of nonlinear coefficients and birefringence was determined: d12/d11= - 3.498±0.171, |d26/d12\ = 0.365±0.010, \d26/d11| = 1.273±0.036, and \nb-na = 0.101±0.018 (at 532 nm).

Original languageEnglish (US)
Pages (from-to)1387-1392
Number of pages6
JournalJournal of Applied Physics
Issue number2
StatePublished - Jan 15 2001

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)


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