Probing Local Electronic Transitions in Organic Semiconductors through Energy-Loss Spectrum Imaging in the Transmission Electron Microscope

Changhe Guo, Frances I. Allen, Youngmin Lee, Thinh P. Le, Chengyu Song, Jim Ciston, Andrew M. Minor, Enrique Daniel Gomez

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Improving the performance of organic electronic devices depends on exploiting the complex nanostructures formed in the active layer. Current imaging methods based on transmission electron microscopy provide limited chemical sensitivity, and thus the application to materials with compositionally similar phases or complicated multicomponent systems is challenging. Here, it is demonstrated that monochromated transmission electron microscopes can generate contrast in organic thin films based on differences in the valence electronic structure at energy losses below 10 eV. In this energy range, electronic fingerprints corresponding to interband excitations in organic semiconductors can be utilized to generate significant spectral contrast between phases. Based on differences in chemical bonding of organic materials, high-contrast images are thus obtained revealing the phase separation in polymer/fullerene mixtures. By applying principal component analysis to the spectroscopic image series, further details about phase compositions and local electronic transitions in the active layer of organic semiconductor mixtures can be explored. Monochromated transmission electron microscopes can generate contrast in organic thin films based on differences in the valence electronic structure at energy losses below 10 eV. By applying principal component analysis to the spectroscopic image series, further details about phase compositions and local electronic transitions in the active layer of organic semiconductor mixtures can be explored.

Original languageEnglish (US)
Pages (from-to)6071-6076
Number of pages6
JournalAdvanced Functional Materials
Volume25
Issue number38
DOIs
StatePublished - Oct 1 2015

Fingerprint

Semiconducting organic compounds
organic semiconductors
Energy dissipation
Electron microscopes
electron microscopes
energy dissipation
Imaging techniques
Phase composition
Principal component analysis
Electronic structure
principal components analysis
electronics
Fullerenes
Thin films
electronic structure
valence
Phase separation
Nanostructures
Polymers
image contrast

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Condensed Matter Physics
  • Electrochemistry

Cite this

Guo, Changhe ; Allen, Frances I. ; Lee, Youngmin ; Le, Thinh P. ; Song, Chengyu ; Ciston, Jim ; Minor, Andrew M. ; Gomez, Enrique Daniel. / Probing Local Electronic Transitions in Organic Semiconductors through Energy-Loss Spectrum Imaging in the Transmission Electron Microscope. In: Advanced Functional Materials. 2015 ; Vol. 25, No. 38. pp. 6071-6076.
@article{e7f63e2e4dee447b89627e3b11cf7d96,
title = "Probing Local Electronic Transitions in Organic Semiconductors through Energy-Loss Spectrum Imaging in the Transmission Electron Microscope",
abstract = "Improving the performance of organic electronic devices depends on exploiting the complex nanostructures formed in the active layer. Current imaging methods based on transmission electron microscopy provide limited chemical sensitivity, and thus the application to materials with compositionally similar phases or complicated multicomponent systems is challenging. Here, it is demonstrated that monochromated transmission electron microscopes can generate contrast in organic thin films based on differences in the valence electronic structure at energy losses below 10 eV. In this energy range, electronic fingerprints corresponding to interband excitations in organic semiconductors can be utilized to generate significant spectral contrast between phases. Based on differences in chemical bonding of organic materials, high-contrast images are thus obtained revealing the phase separation in polymer/fullerene mixtures. By applying principal component analysis to the spectroscopic image series, further details about phase compositions and local electronic transitions in the active layer of organic semiconductor mixtures can be explored. Monochromated transmission electron microscopes can generate contrast in organic thin films based on differences in the valence electronic structure at energy losses below 10 eV. By applying principal component analysis to the spectroscopic image series, further details about phase compositions and local electronic transitions in the active layer of organic semiconductor mixtures can be explored.",
author = "Changhe Guo and Allen, {Frances I.} and Youngmin Lee and Le, {Thinh P.} and Chengyu Song and Jim Ciston and Minor, {Andrew M.} and Gomez, {Enrique Daniel}",
year = "2015",
month = "10",
day = "1",
doi = "10.1002/adfm.201502090",
language = "English (US)",
volume = "25",
pages = "6071--6076",
journal = "Advanced Functional Materials",
issn = "1616-301X",
publisher = "Wiley-VCH Verlag",
number = "38",

}

Probing Local Electronic Transitions in Organic Semiconductors through Energy-Loss Spectrum Imaging in the Transmission Electron Microscope. / Guo, Changhe; Allen, Frances I.; Lee, Youngmin; Le, Thinh P.; Song, Chengyu; Ciston, Jim; Minor, Andrew M.; Gomez, Enrique Daniel.

In: Advanced Functional Materials, Vol. 25, No. 38, 01.10.2015, p. 6071-6076.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Probing Local Electronic Transitions in Organic Semiconductors through Energy-Loss Spectrum Imaging in the Transmission Electron Microscope

AU - Guo, Changhe

AU - Allen, Frances I.

AU - Lee, Youngmin

AU - Le, Thinh P.

AU - Song, Chengyu

AU - Ciston, Jim

AU - Minor, Andrew M.

AU - Gomez, Enrique Daniel

PY - 2015/10/1

Y1 - 2015/10/1

N2 - Improving the performance of organic electronic devices depends on exploiting the complex nanostructures formed in the active layer. Current imaging methods based on transmission electron microscopy provide limited chemical sensitivity, and thus the application to materials with compositionally similar phases or complicated multicomponent systems is challenging. Here, it is demonstrated that monochromated transmission electron microscopes can generate contrast in organic thin films based on differences in the valence electronic structure at energy losses below 10 eV. In this energy range, electronic fingerprints corresponding to interband excitations in organic semiconductors can be utilized to generate significant spectral contrast between phases. Based on differences in chemical bonding of organic materials, high-contrast images are thus obtained revealing the phase separation in polymer/fullerene mixtures. By applying principal component analysis to the spectroscopic image series, further details about phase compositions and local electronic transitions in the active layer of organic semiconductor mixtures can be explored. Monochromated transmission electron microscopes can generate contrast in organic thin films based on differences in the valence electronic structure at energy losses below 10 eV. By applying principal component analysis to the spectroscopic image series, further details about phase compositions and local electronic transitions in the active layer of organic semiconductor mixtures can be explored.

AB - Improving the performance of organic electronic devices depends on exploiting the complex nanostructures formed in the active layer. Current imaging methods based on transmission electron microscopy provide limited chemical sensitivity, and thus the application to materials with compositionally similar phases or complicated multicomponent systems is challenging. Here, it is demonstrated that monochromated transmission electron microscopes can generate contrast in organic thin films based on differences in the valence electronic structure at energy losses below 10 eV. In this energy range, electronic fingerprints corresponding to interband excitations in organic semiconductors can be utilized to generate significant spectral contrast between phases. Based on differences in chemical bonding of organic materials, high-contrast images are thus obtained revealing the phase separation in polymer/fullerene mixtures. By applying principal component analysis to the spectroscopic image series, further details about phase compositions and local electronic transitions in the active layer of organic semiconductor mixtures can be explored. Monochromated transmission electron microscopes can generate contrast in organic thin films based on differences in the valence electronic structure at energy losses below 10 eV. By applying principal component analysis to the spectroscopic image series, further details about phase compositions and local electronic transitions in the active layer of organic semiconductor mixtures can be explored.

UR - http://www.scopus.com/inward/record.url?scp=84943580816&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84943580816&partnerID=8YFLogxK

U2 - 10.1002/adfm.201502090

DO - 10.1002/adfm.201502090

M3 - Article

VL - 25

SP - 6071

EP - 6076

JO - Advanced Functional Materials

JF - Advanced Functional Materials

SN - 1616-301X

IS - 38

ER -