Probing single nanometer-scale particles with scanning tunneling microscopy and spectroscopies

G. S. McCarty, J. C. Love, J. G. Kushmerick, L. F. Charles, Christine Dolan Keating, B. J. Toleno, M. E. Lyn, A. W. Castleman, M. J. Natan, P. S. Weiss

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Scanning tunneling microscopy can be used to isolate single particles on surfaces for further study. Local optical and electronic properties coupled with topographic information collected by the scanning tunneling microscope (STM) give insight into the intrinsic properties of the species under study. Since each spectroscopic measurement is done on a single particle, each sample is 'monodisperse', regardless of the degree of heterogeneity of the original preparation. We illustrate this with three example systems - a metal cluster of known atomic structure, metal nanoparticles dispersed from colloid suspensions, and metallocarbohedrenes (Met-Cars) deposited with other reaction products. Au and Ag nanoparticles were imaged using a photon emission STM. The threshold voltage, the lowest bias voltage at which photons are produced, was determined for Au nanoparticles. Electronic spectra of small clusters of Ni atoms on MoS2 were recorded. Preliminary images of Zr-based Met-Car-containing soot were obtained on Au and MoS2 substrates and partial electronic spectra were recorded of these possible Met-Car particles.

Original languageEnglish (US)
Pages (from-to)459-466
Number of pages8
JournalJournal of Nanoparticle Research
Volume1
Issue number4
DOIs
StatePublished - Jan 1 1999

Fingerprint

Scanning tunneling microscopy
Microscopy
Spectroscopy
scanning tunneling microscopy
Scanning
Microscopes
Railroad cars
Photons
Nanoparticles
Soot
electronic spectra
Microscope
nanoparticles
Metal nanoparticles
Photon
Colloids
Bias voltage
Voltage
Reaction products
Threshold voltage

All Science Journal Classification (ASJC) codes

  • Bioengineering
  • Atomic and Molecular Physics, and Optics
  • Chemistry(all)
  • Modeling and Simulation
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

McCarty, G. S., Love, J. C., Kushmerick, J. G., Charles, L. F., Keating, C. D., Toleno, B. J., ... Weiss, P. S. (1999). Probing single nanometer-scale particles with scanning tunneling microscopy and spectroscopies. Journal of Nanoparticle Research, 1(4), 459-466. https://doi.org/10.1023/A:1010048032304
McCarty, G. S. ; Love, J. C. ; Kushmerick, J. G. ; Charles, L. F. ; Keating, Christine Dolan ; Toleno, B. J. ; Lyn, M. E. ; Castleman, A. W. ; Natan, M. J. ; Weiss, P. S. / Probing single nanometer-scale particles with scanning tunneling microscopy and spectroscopies. In: Journal of Nanoparticle Research. 1999 ; Vol. 1, No. 4. pp. 459-466.
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McCarty, GS, Love, JC, Kushmerick, JG, Charles, LF, Keating, CD, Toleno, BJ, Lyn, ME, Castleman, AW, Natan, MJ & Weiss, PS 1999, 'Probing single nanometer-scale particles with scanning tunneling microscopy and spectroscopies', Journal of Nanoparticle Research, vol. 1, no. 4, pp. 459-466. https://doi.org/10.1023/A:1010048032304

Probing single nanometer-scale particles with scanning tunneling microscopy and spectroscopies. / McCarty, G. S.; Love, J. C.; Kushmerick, J. G.; Charles, L. F.; Keating, Christine Dolan; Toleno, B. J.; Lyn, M. E.; Castleman, A. W.; Natan, M. J.; Weiss, P. S.

In: Journal of Nanoparticle Research, Vol. 1, No. 4, 01.01.1999, p. 459-466.

Research output: Contribution to journalArticle

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