Probing Softmaterials with Energetic Ions Andmolecules

Frommicroscopic Models to the Real World

A. Delcorte, P. Bertrand, Barbara Jane Garrison, K. Hamraoui, T. Mouhib, O. A. Restrepo, C. N. Santos, S. Yunus

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

After introducing a typical example of the performance of C60 clusters for the molecular depth-profiling analysis of (bio-)organic samples by secondary ion mass spectrometry (SIMS), this contribution reviews a few areas in which microscopic models using molecular dynamics (MD) simulations provide a better understanding and predictions in the field of organic sample sputtering. The topics considered discuss about structural effects in crystalline hydrocarbons, the sputtering of hybrid metal-organic surfaces and the influence of the cluster projectile size on molecular desorption and fragmentation. The next section of the article presents experimental studies using real-world samples taken from technological applications in materials science to illustrate some of the strengths and weaknesses ofmolecular analysis and imaging of organic and biological samples by SIMS. Connections with the results of the simulations are pointed out when it is deemed appropriate.

Original languageEnglish (US)
Pages (from-to)1380-1386
Number of pages7
JournalSurface and Interface Analysis
Volume42
Issue number8
DOIs
StatePublished - Aug 1 2010

Fingerprint

Secondary ion mass spectrometry
Sputtering
Ions
Depth profiling
Materials science
Projectiles
Hydrocarbons
secondary ion mass spectrometry
Molecular dynamics
Desorption
ions
sputtering
Metals
Crystalline materials
Imaging techniques
Computer simulation
materials science
projectiles
fragmentation
simulation

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Materials Chemistry
  • Surfaces, Coatings and Films

Cite this

Delcorte, A., Bertrand, P., Garrison, B. J., Hamraoui, K., Mouhib, T., Restrepo, O. A., ... Yunus, S. (2010). Probing Softmaterials with Energetic Ions Andmolecules: Frommicroscopic Models to the Real World. Surface and Interface Analysis, 42(8), 1380-1386. https://doi.org/10.1002/sia.3270
Delcorte, A. ; Bertrand, P. ; Garrison, Barbara Jane ; Hamraoui, K. ; Mouhib, T. ; Restrepo, O. A. ; Santos, C. N. ; Yunus, S. / Probing Softmaterials with Energetic Ions Andmolecules : Frommicroscopic Models to the Real World. In: Surface and Interface Analysis. 2010 ; Vol. 42, No. 8. pp. 1380-1386.
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Delcorte, A, Bertrand, P, Garrison, BJ, Hamraoui, K, Mouhib, T, Restrepo, OA, Santos, CN & Yunus, S 2010, 'Probing Softmaterials with Energetic Ions Andmolecules: Frommicroscopic Models to the Real World', Surface and Interface Analysis, vol. 42, no. 8, pp. 1380-1386. https://doi.org/10.1002/sia.3270

Probing Softmaterials with Energetic Ions Andmolecules : Frommicroscopic Models to the Real World. / Delcorte, A.; Bertrand, P.; Garrison, Barbara Jane; Hamraoui, K.; Mouhib, T.; Restrepo, O. A.; Santos, C. N.; Yunus, S.

In: Surface and Interface Analysis, Vol. 42, No. 8, 01.08.2010, p. 1380-1386.

Research output: Contribution to journalArticle

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AU - Delcorte, A.

AU - Bertrand, P.

AU - Garrison, Barbara Jane

AU - Hamraoui, K.

AU - Mouhib, T.

AU - Restrepo, O. A.

AU - Santos, C. N.

AU - Yunus, S.

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Delcorte A, Bertrand P, Garrison BJ, Hamraoui K, Mouhib T, Restrepo OA et al. Probing Softmaterials with Energetic Ions Andmolecules: Frommicroscopic Models to the Real World. Surface and Interface Analysis. 2010 Aug 1;42(8):1380-1386. https://doi.org/10.1002/sia.3270