Probing symmetry properties of few-layer MoS2 and h-BN by optical second-harmonic generation

Yilei Li, Yi Rao, Kin Fai Mak, Yumeng You, Shuyuan Wang, Cory R. Dean, Tony F. Heinz

Research output: Contribution to journalArticle

444 Scopus citations

Abstract

We have measured optical second-harmonic generation (SHG) from atomically thin samples of MoS2 and h-BN with one to five layers. We observe strong SHG from materials with odd layer thickness, for which a noncentrosymmetric structure is expected, while the centrosymmetric materials with even layer thickness do not yield appreciable SHG. SHG for materials with odd layer thickness was measured as a function of crystal orientation. This dependence reveals the rotational symmetry of the lattice and is shown to provide a purely optical method of determining the orientation of crystallographic axes. We report values for the nonlinearity of monolayers and odd-layers of MoS2 and h-BN and compare the variation as a function of layer thickness with a model that accounts for wave propagation effects.

Original languageEnglish (US)
Pages (from-to)3329-3333
Number of pages5
JournalNano letters
Volume13
Issue number7
DOIs
StatePublished - Jul 10 2013

All Science Journal Classification (ASJC) codes

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering

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    Li, Y., Rao, Y., Mak, K. F., You, Y., Wang, S., Dean, C. R., & Heinz, T. F. (2013). Probing symmetry properties of few-layer MoS2 and h-BN by optical second-harmonic generation. Nano letters, 13(7), 3329-3333. https://doi.org/10.1021/nl401561r