Process-oriented basis representations for statistical process control (SPC)

David R. Gonzalez-Barreto, Russell R. Barton

Research output: Contribution to conferencePaperpeer-review

1 Scopus citations

Abstract

This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

Original languageEnglish (US)
Pages954-958
Number of pages5
StatePublished - Dec 1 1995
EventProceedings of the 1995 4th Industrial Engineering Research Conference - Nashville, TN, USA
Duration: May 24 1995May 25 1995

Other

OtherProceedings of the 1995 4th Industrial Engineering Research Conference
CityNashville, TN, USA
Period5/24/955/25/95

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering

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