Process-oriented basis representations for statistical process control (SPC)

David R. Gonzalez-Barreto, Russell Richard Barton

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

Original languageEnglish (US)
Title of host publicationIndustrial Engineering Research - Conference Proceedings
PublisherIIE
Pages954-958
Number of pages5
StatePublished - 1995
EventProceedings of the 1995 4th Industrial Engineering Research Conference - Nashville, TN, USA
Duration: May 24 1995May 25 1995

Other

OtherProceedings of the 1995 4th Industrial Engineering Research Conference
CityNashville, TN, USA
Period5/24/955/25/95

Fingerprint

Statistical process control

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering

Cite this

Gonzalez-Barreto, D. R., & Barton, R. R. (1995). Process-oriented basis representations for statistical process control (SPC). In Industrial Engineering Research - Conference Proceedings (pp. 954-958). IIE.
Gonzalez-Barreto, David R. ; Barton, Russell Richard. / Process-oriented basis representations for statistical process control (SPC). Industrial Engineering Research - Conference Proceedings. IIE, 1995. pp. 954-958
@inproceedings{953ed02fa5014b5695b6c7bbbc001604,
title = "Process-oriented basis representations for statistical process control (SPC)",
abstract = "This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.",
author = "Gonzalez-Barreto, {David R.} and Barton, {Russell Richard}",
year = "1995",
language = "English (US)",
pages = "954--958",
booktitle = "Industrial Engineering Research - Conference Proceedings",
publisher = "IIE",

}

Gonzalez-Barreto, DR & Barton, RR 1995, Process-oriented basis representations for statistical process control (SPC). in Industrial Engineering Research - Conference Proceedings. IIE, pp. 954-958, Proceedings of the 1995 4th Industrial Engineering Research Conference, Nashville, TN, USA, 5/24/95.

Process-oriented basis representations for statistical process control (SPC). / Gonzalez-Barreto, David R.; Barton, Russell Richard.

Industrial Engineering Research - Conference Proceedings. IIE, 1995. p. 954-958.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Process-oriented basis representations for statistical process control (SPC)

AU - Gonzalez-Barreto, David R.

AU - Barton, Russell Richard

PY - 1995

Y1 - 1995

N2 - This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

AB - This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

UR - http://www.scopus.com/inward/record.url?scp=0029426062&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029426062&partnerID=8YFLogxK

M3 - Conference contribution

SP - 954

EP - 958

BT - Industrial Engineering Research - Conference Proceedings

PB - IIE

ER -

Gonzalez-Barreto DR, Barton RR. Process-oriented basis representations for statistical process control (SPC). In Industrial Engineering Research - Conference Proceedings. IIE. 1995. p. 954-958