Process-oriented basis representations for statistical process control (SPC)

David R. Gonzalez-Barreto, Russell Richard Barton

Research output: Contribution to conferencePaper

1 Citation (Scopus)

Abstract

This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

Original languageEnglish (US)
Pages954-958
Number of pages5
StatePublished - Dec 1 1995
EventProceedings of the 1995 4th Industrial Engineering Research Conference - Nashville, TN, USA
Duration: May 24 1995May 25 1995

Other

OtherProceedings of the 1995 4th Industrial Engineering Research Conference
CityNashville, TN, USA
Period5/24/955/25/95

Fingerprint

Statistical process control

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering

Cite this

Gonzalez-Barreto, D. R., & Barton, R. R. (1995). Process-oriented basis representations for statistical process control (SPC). 954-958. Paper presented at Proceedings of the 1995 4th Industrial Engineering Research Conference, Nashville, TN, USA, .
Gonzalez-Barreto, David R. ; Barton, Russell Richard. / Process-oriented basis representations for statistical process control (SPC). Paper presented at Proceedings of the 1995 4th Industrial Engineering Research Conference, Nashville, TN, USA, .5 p.
@conference{953ed02fa5014b5695b6c7bbbc001604,
title = "Process-oriented basis representations for statistical process control (SPC)",
abstract = "This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.",
author = "Gonzalez-Barreto, {David R.} and Barton, {Russell Richard}",
year = "1995",
month = "12",
day = "1",
language = "English (US)",
pages = "954--958",
note = "Proceedings of the 1995 4th Industrial Engineering Research Conference ; Conference date: 24-05-1995 Through 25-05-1995",

}

Gonzalez-Barreto, DR & Barton, RR 1995, 'Process-oriented basis representations for statistical process control (SPC)', Paper presented at Proceedings of the 1995 4th Industrial Engineering Research Conference, Nashville, TN, USA, 5/24/95 - 5/25/95 pp. 954-958.

Process-oriented basis representations for statistical process control (SPC). / Gonzalez-Barreto, David R.; Barton, Russell Richard.

1995. 954-958 Paper presented at Proceedings of the 1995 4th Industrial Engineering Research Conference, Nashville, TN, USA, .

Research output: Contribution to conferencePaper

TY - CONF

T1 - Process-oriented basis representations for statistical process control (SPC)

AU - Gonzalez-Barreto, David R.

AU - Barton, Russell Richard

PY - 1995/12/1

Y1 - 1995/12/1

N2 - This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

AB - This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

UR - http://www.scopus.com/inward/record.url?scp=0029426062&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029426062&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0029426062

SP - 954

EP - 958

ER -

Gonzalez-Barreto DR, Barton RR. Process-oriented basis representations for statistical process control (SPC). 1995. Paper presented at Proceedings of the 1995 4th Industrial Engineering Research Conference, Nashville, TN, USA, .