Profiling Memory Vulnerability of Big-Data Applications

N. Rameshan, R. Birke, L. Navarro, V. Vlassov, B. Urgaonkar, G. Kesidis, M. Schmatz, L. Y. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Motivated by the increasing popularity of hosting in-memory big-data analytics in cloud, we present a profiling methodology that can understand how different memory subsystems, i.e., cache and memory bandwidth, are susceptible to the impact of interference from co-located applications. We first describe the design of the proposed tool and demonstrate a case study consisting of five Spark applications on real-life data set.

Original languageEnglish (US)
Title of host publicationProceedings - 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN-W 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages258-261
Number of pages4
ISBN (Electronic)9781467388917
DOIs
StatePublished - Sep 22 2016
Event46th IEEE/IFIP International Conference on Dependable Systems and Networks, DSN-W 2016 - Toulouse, France
Duration: Jun 28 2016Jul 1 2016

Publication series

NameProceedings - 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN-W 2016

Other

Other46th IEEE/IFIP International Conference on Dependable Systems and Networks, DSN-W 2016
CountryFrance
CityToulouse
Period6/28/167/1/16

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Control and Optimization

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    Rameshan, N., Birke, R., Navarro, L., Vlassov, V., Urgaonkar, B., Kesidis, G., Schmatz, M., & Chen, L. Y. (2016). Profiling Memory Vulnerability of Big-Data Applications. In Proceedings - 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN-W 2016 (pp. 258-261). [7575390] (Proceedings - 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN-W 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DSN-W.2016.58