Proton radiation damage experiment on a hybrid CMOS detector

Evan Bray, Abraham D. Falcone, Mitchell Wages, David N. Burrows, Carl R. Brune, Donald Carter, Devon Jacobs

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

We report on the initial results of an experiment to determine the effects of proton radiation damage on an X-ray hybrid CMOS detector (HCD). The device was irradiated at the Edwards Accelerator Lab at Ohio University with 8 MeV protons, up to a total absorbed dose of 3 krad(Si) (4.5 × 109 protons/cm2). The effects of this radiation on read noise, dark current, gain, and energy resolution are then analyzed. This exposure is the first of several which will be used for characterizing detector performance at absorbed dose levels that are relevant for imaging devices operating in a deep-space environment.

Original languageEnglish (US)
Title of host publicationHigh Energy, Optical, and Infrared Detectors for Astronomy VIII
EditorsAndrew D. Holland, James Beletic
PublisherSPIE
ISBN (Print)9781510619715
DOIs
StatePublished - Jan 1 2018
EventHigh Energy, Optical, and Infrared Detectors for Astronomy VIII 2018 - Austin, United States
Duration: Jun 10 2018Jun 13 2018

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10709
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherHigh Energy, Optical, and Infrared Detectors for Astronomy VIII 2018
CountryUnited States
CityAustin
Period6/10/186/13/18

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Bray, E., Falcone, A. D., Wages, M., Burrows, D. N., Brune, C. R., Carter, D., & Jacobs, D. (2018). Proton radiation damage experiment on a hybrid CMOS detector. In A. D. Holland, & J. Beletic (Eds.), High Energy, Optical, and Infrared Detectors for Astronomy VIII [107090L] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10709). SPIE. https://doi.org/10.1117/12.2312636