Pyrite in aqueous systems: semiconductor properties, oxidative dissolution and environment control

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

The aqueous chemistry of pyride (FeS2) is considered, with emphasis on the relationship between the semiconductor properties of the solid and the characteristics of the interfacial oxidative decomposition reactions. With the aid of energy level correlations which compare the band edges of pyrite with the energy levels of selected redox couples, the relative importance of valence band holes and conduction band electrons in the corresponding interfacial charge transfer reactions is ascertained. Energy level correlations are also presented which show that the oxidative decomposition of pyrite via a hole pathway is thermodynamically feasible in both acidic and basic solutions. Electrochemical mechanisms are presented which yield rate laws that are consistent with published kinetic data. The upper region of the valence band of pyrite consists of completely filled iron d-orbitals and these impart catalytic properties to the solid surface. The critical role played in the oxidative decomposition process by the interaction between the surface Fe d-states and OH2 and OHMIN species in the aqueous phase is highlighted. Implications for environmental control and waste utilization are discussed.

Original languageEnglish (US)
Title of host publicationFirst International Conference on Processing Materials for Properties
PublisherPubl by Minerals, Metals & Materials Soc (TMS)
Pages83-89
Number of pages7
ISBN (Print)0873392566
StatePublished - Dec 1 1993
EventProceedings of the 1st International Conference on Processing Materials for Properties - Honolulu, HI, USA
Duration: Nov 7 1993Nov 10 1993

Publication series

NameFirst International Conference on Processing Materials for Properties

Other

OtherProceedings of the 1st International Conference on Processing Materials for Properties
CityHonolulu, HI, USA
Period11/7/9311/10/93

Fingerprint

Pyrites
Electron energy levels
Dissolution
Semiconductor materials
Valence bands
Decomposition
Waste utilization
Conduction bands
Charge transfer
Iron
Kinetics
Electrons

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Osseo-Asare, K. A. (1993). Pyrite in aqueous systems: semiconductor properties, oxidative dissolution and environment control. In First International Conference on Processing Materials for Properties (pp. 83-89). (First International Conference on Processing Materials for Properties). Publ by Minerals, Metals & Materials Soc (TMS).
Osseo-Asare, Kwadwo Asare. / Pyrite in aqueous systems : semiconductor properties, oxidative dissolution and environment control. First International Conference on Processing Materials for Properties. Publ by Minerals, Metals & Materials Soc (TMS), 1993. pp. 83-89 (First International Conference on Processing Materials for Properties).
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Osseo-Asare, KA 1993, Pyrite in aqueous systems: semiconductor properties, oxidative dissolution and environment control. in First International Conference on Processing Materials for Properties. First International Conference on Processing Materials for Properties, Publ by Minerals, Metals & Materials Soc (TMS), pp. 83-89, Proceedings of the 1st International Conference on Processing Materials for Properties, Honolulu, HI, USA, 11/7/93.

Pyrite in aqueous systems : semiconductor properties, oxidative dissolution and environment control. / Osseo-Asare, Kwadwo Asare.

First International Conference on Processing Materials for Properties. Publ by Minerals, Metals & Materials Soc (TMS), 1993. p. 83-89 (First International Conference on Processing Materials for Properties).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Osseo-Asare KA. Pyrite in aqueous systems: semiconductor properties, oxidative dissolution and environment control. In First International Conference on Processing Materials for Properties. Publ by Minerals, Metals & Materials Soc (TMS). 1993. p. 83-89. (First International Conference on Processing Materials for Properties).