Quantification of void pinning effects during grain growth of nanocrystalline iron

G. A. Vetterick, O. El-Atwani, J. Kevin Baldwin, M. R. Tonks, M. L. Taheri

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


In-situ transmission electron microscopy (TEM) annealing experiments, coupled with an analytical model, compared void pinning effects in nanocrystalline Fe films during grain growth. Voided grain boundaries were shown to have nearly four orders of magnitude less grain boundary mobility than void-free grain boundaries. However the coverage of the grain boundaries by pores was over three times that which would be required for static particles to completely halt grain boundary migration. Grain boundary migration continued because the pores were dragged by the grain boundaries and continued to evolve and coalesce. Thus, pores can slow grain boundary migration but are not an effective means of fully stabilizing nanocrystalline grain size at high temperatures.

Original languageEnglish (US)
Pages (from-to)62-65
Number of pages4
JournalJournal of Nuclear Materials
StatePublished - Dec 1 2016

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Materials Science(all)
  • Nuclear Energy and Engineering


Dive into the research topics of 'Quantification of void pinning effects during grain growth of nanocrystalline iron'. Together they form a unique fingerprint.

Cite this