Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations

Sven Gustafson, Wolfgang Ludwig, Paul Shade, Diwakar Naragani, Darren Pagan, Phil Cook, Can Yildirim, Carsten Detlefs, Michael D. Sangid

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

During cyclic loading, localization of intragranular deformation due to crystallographic slip acts as a precursor for crack initiation, often at coherent twin boundaries. A suite of high-resolution synchrotron X-ray characterizations, coupled with a crystal plasticity simulation, was conducted on a polycrystalline nickel-based superalloy microstructure near a parent-twin boundary in order to understand the deformation localization behavior of this critical, 3D microstructural configuration. Dark-field X-ray microscopy was spatially linked to high energy X-ray diffraction microscopy and X-ray diffraction contrast tomography in order to quantify, with cutting-edge resolution, an intragranular misorientation and high elastic strain gradients near a twin boundary. These observations quantify the extreme sub-grain scale stress gradients present in polycrystalline microstructures, which often lead to fatigue failure.

Original languageEnglish (US)
Article number3189
JournalNature communications
Volume11
Issue number1
DOIs
StatePublished - Dec 1 2020

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Biochemistry, Genetics and Molecular Biology(all)
  • Physics and Astronomy(all)

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