Quantitative determination of tip parameters in piezoresponse force microscopy

Sergei V. Kalinin, Stephen Jesse, Brian J. Rodriguez, Eugene A. Eliseev, Venkatraman Gopalan, Anna N. Morozovska

Research output: Contribution to journalArticle

26 Scopus citations

Abstract

One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180° domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.

Original languageEnglish (US)
Article number212905
JournalApplied Physics Letters
Volume90
Issue number21
DOIs
StatePublished - Jun 1 2007

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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    Kalinin, S. V., Jesse, S., Rodriguez, B. J., Eliseev, E. A., Gopalan, V., & Morozovska, A. N. (2007). Quantitative determination of tip parameters in piezoresponse force microscopy. Applied Physics Letters, 90(21), [212905]. https://doi.org/10.1063/1.2742900