QUANTITATIVE SURFACE STUDIES WITH X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) AND SECONDARY ION MASS SPECTROSCOPY (SIMS).

N. Winograd, A. Shepard, R. Hewitt, W. Baitinger, N. Delgass

Research output: Contribution to conferencePaperpeer-review

6 Scopus citations

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Engineering & Materials Science