Radiation-induced leakage currents: Atomic scale mechanisms

Patrick M. Lenahan, J. P. Campbell, A. Y. Kang, S. T. Liu, R. A. Weimer

Research output: Contribution to journalConference article

18 Scopus citations

Abstract

We link atomic-scale defects called E′ centers to ra- diation-induced leakage current (RILC). We present evidence that strongly suggests that RILC tolerance is processing dependent and that this tolerance appears to be correlated with lower E′ center generation. We furthermore note that in oxides subjected to quite high irradiation levels, the density of (generally electrically neutral) E′ centers is far greater than would be expected for the hole trap E′ centers involved in the radiation-induced positive charge buildup observed in thicker oxides.

Original languageEnglish (US)
Pages (from-to)2101-2106
Number of pages6
JournalIEEE Transactions on Nuclear Science
Volume48
Issue number6 I
DOIs
StatePublished - Dec 1 2001
Event2001 Nuclear and Sapce Radiation Effects Conference (NSREC) - Vancouver, BC, Canada
Duration: Jul 16 2001Jul 20 2001

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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