Radiation-induced oxide charge in low- and high-H 2 environments

Nicole L. Rowsey, Mark E. Law, Ronald D. Schrimpf, Daniel M. Fleetwood, Blair Richard Tuttle, Sokrates T. Pantelides

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Electronic structure calculations and irradiation measurements are used to obtain insight into oxide trapped charge mechanisms in varying hydrogen ambients. Hole trapping dominates for typical H 2 densities, but protons can dominate at high H 2 densities.

Original languageEnglish (US)
Title of host publicationRADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings
Pages51-53
Number of pages3
DOIs
StatePublished - 2011
Event12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011 - Sevilla, Spain
Duration: Sep 19 2011Sep 23 2011

Other

Other12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011
CountrySpain
CitySevilla
Period9/19/119/23/11

Fingerprint

trapping
electronic structure
Radiation
Hydrogen
irradiation
Oxides
oxides
hydrogen
radiation
Electronic structure
Protons
Irradiation

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Radiation

Cite this

Rowsey, N. L., Law, M. E., Schrimpf, R. D., Fleetwood, D. M., Tuttle, B. R., & Pantelides, S. T. (2011). Radiation-induced oxide charge in low- and high-H 2 environments. In RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings (pp. 51-53). [6131384] https://doi.org/10.1109/RADECS.2011.6131384
Rowsey, Nicole L. ; Law, Mark E. ; Schrimpf, Ronald D. ; Fleetwood, Daniel M. ; Tuttle, Blair Richard ; Pantelides, Sokrates T. / Radiation-induced oxide charge in low- and high-H 2 environments. RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings. 2011. pp. 51-53
@inproceedings{a785dcb346eb48b4b77224dc686f0dae,
title = "Radiation-induced oxide charge in low- and high-H 2 environments",
abstract = "Electronic structure calculations and irradiation measurements are used to obtain insight into oxide trapped charge mechanisms in varying hydrogen ambients. Hole trapping dominates for typical H 2 densities, but protons can dominate at high H 2 densities.",
author = "Rowsey, {Nicole L.} and Law, {Mark E.} and Schrimpf, {Ronald D.} and Fleetwood, {Daniel M.} and Tuttle, {Blair Richard} and Pantelides, {Sokrates T.}",
year = "2011",
doi = "10.1109/RADECS.2011.6131384",
language = "English (US)",
isbn = "9781457705878",
pages = "51--53",
booktitle = "RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings",

}

Rowsey, NL, Law, ME, Schrimpf, RD, Fleetwood, DM, Tuttle, BR & Pantelides, ST 2011, Radiation-induced oxide charge in low- and high-H 2 environments. in RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings., 6131384, pp. 51-53, 12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011, Sevilla, Spain, 9/19/11. https://doi.org/10.1109/RADECS.2011.6131384

Radiation-induced oxide charge in low- and high-H 2 environments. / Rowsey, Nicole L.; Law, Mark E.; Schrimpf, Ronald D.; Fleetwood, Daniel M.; Tuttle, Blair Richard; Pantelides, Sokrates T.

RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings. 2011. p. 51-53 6131384.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Radiation-induced oxide charge in low- and high-H 2 environments

AU - Rowsey, Nicole L.

AU - Law, Mark E.

AU - Schrimpf, Ronald D.

AU - Fleetwood, Daniel M.

AU - Tuttle, Blair Richard

AU - Pantelides, Sokrates T.

PY - 2011

Y1 - 2011

N2 - Electronic structure calculations and irradiation measurements are used to obtain insight into oxide trapped charge mechanisms in varying hydrogen ambients. Hole trapping dominates for typical H 2 densities, but protons can dominate at high H 2 densities.

AB - Electronic structure calculations and irradiation measurements are used to obtain insight into oxide trapped charge mechanisms in varying hydrogen ambients. Hole trapping dominates for typical H 2 densities, but protons can dominate at high H 2 densities.

UR - http://www.scopus.com/inward/record.url?scp=84860160788&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84860160788&partnerID=8YFLogxK

U2 - 10.1109/RADECS.2011.6131384

DO - 10.1109/RADECS.2011.6131384

M3 - Conference contribution

SN - 9781457705878

SP - 51

EP - 53

BT - RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings

ER -

Rowsey NL, Law ME, Schrimpf RD, Fleetwood DM, Tuttle BR, Pantelides ST. Radiation-induced oxide charge in low- and high-H 2 environments. In RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings. 2011. p. 51-53. 6131384 https://doi.org/10.1109/RADECS.2011.6131384