Radiation-induced oxide charge in low- and high-H 2 environments

Nicole L. Rowsey, Mark E. Law, Ronald D. Schrimpf, Daniel M. Fleetwood, Blair Richard Tuttle, Sokrates T. Pantelides

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Electronic structure calculations and irradiation measurements are used to obtain insight into oxide trapped charge mechanisms in varying hydrogen ambients. Hole trapping dominates for typical H 2 densities, but protons can dominate at high H 2 densities.

Original languageEnglish (US)
Title of host publicationRADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings
Pages51-53
Number of pages3
DOIs
StatePublished - 2011
Event12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011 - Sevilla, Spain
Duration: Sep 19 2011Sep 23 2011

Other

Other12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011
CountrySpain
CitySevilla
Period9/19/119/23/11

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Radiation

Cite this

Rowsey, N. L., Law, M. E., Schrimpf, R. D., Fleetwood, D. M., Tuttle, B. R., & Pantelides, S. T. (2011). Radiation-induced oxide charge in low- and high-H 2 environments. In RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings (pp. 51-53). [6131384] https://doi.org/10.1109/RADECS.2011.6131384