Raman spectroscopic sensing using whispering gallery microresonators

Perry Edwards, Corey Janisch, Bo Peng, Sahin Ozdemir, Lan Yang, Zhiwen Liu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We investigate Raman spectroscopic sensing using whispering gallery microresonators as a label-free method toward single particle detection. Whispering gallery mode microresonators are used as platforms to perform sensitive particle detection by exploiting the strong, evanescent field of a resonant mode exposed on the surface of the microresonator. Particles adhered to the microresonator surface interact with the field and scatter photons circulating within the resonator. In particular, Raman scattered photons are detected, providing molecular-specific "fingerprint" information regarding the adhered particles. The exploitation of a resonant mode allows for enhancement of generated Raman signal over traditional methods of spontaneous Raman scattering. Preliminary proof-of-concept experimental results are shown.

Original languageEnglish (US)
Title of host publicationUltrafast Imaging and Spectroscopy
PublisherSPIE
ISBN (Print)9780819496959
DOIs
StatePublished - Jan 1 2013
EventUltrafast Imaging and Spectroscopy - San Diego, CA, United States
Duration: Aug 25 2013Aug 26 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8845
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherUltrafast Imaging and Spectroscopy
CountryUnited States
CitySan Diego, CA
Period8/25/138/26/13

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Edwards, P., Janisch, C., Peng, B., Ozdemir, S., Yang, L., & Liu, Z. (2013). Raman spectroscopic sensing using whispering gallery microresonators. In Ultrafast Imaging and Spectroscopy [884512] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8845). SPIE. https://doi.org/10.1117/12.2024707