Random jitter elimination from high speed links using Kalman filtering

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, a new and simple approach is presented to remove random jitter and intersymbol interference (ISI) effects from NRZ (Non-Return-to-Zero) signals. The method presented uses a Kalman filter to predict and remove the random jitter noise and Intersymbol Interference (ISI). Random jitter is modeled as a Gaussian distribution, with jitter effects on both rise and fall times of the signal. The Kalman filter adapts based on the provided model and predicts the exact position of the rise and fall times of the clock signal and a look-up table, combined with the Kalman filter, predicts the exact level of the signal. Random jitter and ISI simulations in MATLAB are presented and the results obtained are highly promising. The method provides a new approach to remove jitter from high-speed links without the use of clock data recovery circuits, feedforward and feedback equalizers.

Original languageEnglish (US)
Title of host publication2018 IEEE International Conference on Consumer Electronics, ICCE 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-3
Number of pages3
Volume2018-January
ISBN (Electronic)9781538630259
DOIs
Publication statusPublished - Mar 26 2018
Event2018 IEEE International Conference on Consumer Electronics, ICCE 2018 - Las Vegas, United States
Duration: Jan 12 2018Jan 14 2018

Other

Other2018 IEEE International Conference on Consumer Electronics, ICCE 2018
CountryUnited States
CityLas Vegas
Period1/12/181/14/18

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All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Media Technology

Cite this

Ayub, A., Morales, A. W., & Agili, S. S. (2018). Random jitter elimination from high speed links using Kalman filtering. In 2018 IEEE International Conference on Consumer Electronics, ICCE 2018 (Vol. 2018-January, pp. 1-3). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCE.2018.8326327