Rapid convergence in fault tolerant adaptive algorithms

Robert A. Soni, Kyle A. Gallivan, William Kenneth Jenkins

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Reliable methods in adaptive filtering require introduction of redundancy into the design of adaptive filter structures. Unfortunately, this form of redundancy can severely impair the convergence rate of the adaptive filtering algorithm. The covariance matrix of the input to the adaptive filter becomes ill-conditioned due to the introduction of redundancy. Recently, affine projection, and accelerated data reusing algorithms have been proposed as a viable methods to accelerate performance in situations where the auto-correlation matrix becomes ill-conditioned. In this paper, some of these methods are explored to accelerate the performance of fault tolerant algorithms. The use of these acceleration algorithms can be seen to significantly improve the performance over that achieved by conventional LMS and LMS-transform domain fault tolerant algorithms.

    Original languageEnglish (US)
    Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems
    PublisherIEEE
    ISBN (Print)0780354710
    StatePublished - Jan 1 1999
    EventProceedings of the 1999 IEEE International Symposium on Circuits and Systems, ISCAS '99 - Orlando, FL, USA
    Duration: May 30 1999Jun 2 1999

    Publication series

    NameProceedings - IEEE International Symposium on Circuits and Systems
    Volume3
    ISSN (Print)0271-4310

    Other

    OtherProceedings of the 1999 IEEE International Symposium on Circuits and Systems, ISCAS '99
    CityOrlando, FL, USA
    Period5/30/996/2/99

      Fingerprint

    All Science Journal Classification (ASJC) codes

    • Electrical and Electronic Engineering

    Cite this

    Soni, R. A., Gallivan, K. A., & Jenkins, W. K. (1999). Rapid convergence in fault tolerant adaptive algorithms. In Proceedings - IEEE International Symposium on Circuits and Systems (Proceedings - IEEE International Symposium on Circuits and Systems; Vol. 3). IEEE.