Rapid screening of molecular arrays using imaging TOF-SIMS

J. Y. Xu, R. M. Braun, N. Winograd

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

We explored the application of imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) to the high-throughput analysis needed for combinatorial chemistry research. Prototypical examples include the characterization of polymer resins, which are chemically modified as part of a combinatorial library synthesis. We studied sample conditioning for various polymer matrices, linker systems, and analytes attached to the linkers and found that the hydrophilicity of the supporting substrates play a very important role in confining the signals to a localized area. We also developed protocols for the high-throughput purpose that use specially designed substrates to hold a large number of resins (as many as 10,000), which avoids cross-contamination among components. Using this approach, we are able to perform chemical assays on polymer resins at a rate of about 1-10 s -1 . This analysis has equivalent chemical specificity and sensitivity to but a speed at least an order of magnitude faster than that of ESI-MS or LC-MS.

Original languageEnglish (US)
Pages (from-to)201-204
Number of pages4
JournalApplied Surface Science
Volume203-204
DOIs
StatePublished - Jan 15 2003

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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