Read optimized MRAM with separate read-write paths based on concerted operation of magnetic tunnel junction with correlated material

Ahmedullah Aziz, Nikhil Shukla, Suman Datta, Sumeet Kumar Gupta

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Scopus citations

    Abstract

    We propose a technique based on connecting CM like VO2 in parallel with the MTJ in the read path of multi-port MRAMs. Utilizing insulator-metal transitions in CM, the proposed cell achieves 1.7X to 4.3X improvement in cell TMR (CTMR) along with 7% to 22% higher read disturb margin compared to a baseline cell. Due to the separation of read-write paths in multi-port MRAMs, the CM has no effect on the write operation. The proposed idea is not limited to VO2 and its benefits may be further enhanced by exploring other suitable CMs [6] or by tuning the properties like resistivities, critical currents and thermal stability by techniques like strain [7] or Cr doping [8].

    Original languageEnglish (US)
    Title of host publication73rd Annual Device Research Conference, DRC 2015
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages43-44
    Number of pages2
    ISBN (Electronic)9781467381345
    DOIs
    StatePublished - Aug 3 2015
    Event73rd Annual Device Research Conference, DRC 2015 - Columbus, United States
    Duration: Jun 21 2015Jun 24 2015

    Publication series

    NameDevice Research Conference - Conference Digest, DRC
    Volume2015-August
    ISSN (Print)1548-3770

    Other

    Other73rd Annual Device Research Conference, DRC 2015
    CountryUnited States
    CityColumbus
    Period6/21/156/24/15

    All Science Journal Classification (ASJC) codes

    • Electrical and Electronic Engineering

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  • Cite this

    Aziz, A., Shukla, N., Datta, S., & Gupta, S. K. (2015). Read optimized MRAM with separate read-write paths based on concerted operation of magnetic tunnel junction with correlated material. In 73rd Annual Device Research Conference, DRC 2015 (pp. 43-44). [7175544] (Device Research Conference - Conference Digest, DRC; Vol. 2015-August). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DRC.2015.7175544