Reducing the Matrix Effect in Molecular Secondary Ion Mass Spectrometry by Laser Post-Ionization

Lars Breuer, Nicholas J. Popczun, Andreas Wucher, Nicholas Winograd

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Strategies to reduce and overcome matrix effects in molecular secondary ion mass spectrometry (SIMS) are investigated using laser-based post-ionization of sputtered neutral organic molecules released under C60+ bombardment. Using a two-component multilayer film similar to that employed in a recent VAMAS interlaboratory study, SIMS depth profiles of the protonated and deprotonated quasi-molecular ions of two well-studied organic molecules, Irganox 1010 and Irganox 1098, were measured along with that of the corresponding neutral precursor molecules. When compared to composition-dependent ionization probability changes of the secondary ions, the resulting profiles are much improved. We demonstrate that detection of neutral molecules via laser post-ionization yields significantly reduced matrix effects when compared to SIMS depth profiles in both positive and negative secondary ion mode. These results suggest that this approach may provide a useful pathway for acquiring depth profiles from complex organic samples with improved capabilities for quantitation. (Figure Presented).

Original languageEnglish (US)
Pages (from-to)19705-19715
Number of pages11
JournalJournal of Physical Chemistry C
Volume121
Issue number36
DOIs
StatePublished - Sep 14 2017

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Energy(all)
  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films

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