Reflection at the Motohiro-Taga interface of two anisotropic materials with columnar microstructures

Akhlesh Lakhtakia, Russell F. Messier

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

While a thin film with columnar microstructures is growing, a Motohiro-Taga interface is formed when the angle of inclination of the microstructures is abruptly altered in a vertical plane. Reflection of a normally incident plane wave by a Motohiro-Taga interface has been studied. If the plane wave is TE-polarized with respect to the plane containing the directions of inclination of the columnar microstructures, it is not reflected by the interface; but a TM- polarized plane wave is partially reflected. Because of its polarization-discrimination property, the Motohiro-Taga interface will find application as the basis for devices in the upper millimeter wave and the lower infrared frequency ranges.

Original languageEnglish (US)
Pages (from-to)2529-2534
Number of pages6
JournalOptical Engineering
Volume33
Issue number8
DOIs
StatePublished - Jan 1 1994

Fingerprint

microstructure
Microstructure
plane waves
inclination
Millimeter waves
Polarization
millimeter waves
Infrared radiation
discrimination
Thin films
frequency ranges
polarization
thin films

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

Cite this

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Reflection at the Motohiro-Taga interface of two anisotropic materials with columnar microstructures. / Lakhtakia, Akhlesh; Messier, Russell F.

In: Optical Engineering, Vol. 33, No. 8, 01.01.1994, p. 2529-2534.

Research output: Contribution to journalArticle

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