Refractive index anisotropy in optics using a birefringence mapper

Jennifer Sternal, Shai N. Shafrir, Joseph A. Randi, Leslie L. Gregg, Stephen D. Jacobs

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Areal maps of optical retardance are rapidly generated for flat, transmissive optics using a new commercial birefringence mapper. The versatility and capabilities of the mapper are evaluated for a series of parts that include laser glass samples, laser damaged glass, liquid crystal devices, birefringent crystals, and polymers. Potential users may be trained to use the instrument in less than one hour.

Original languageEnglish (US)
Title of host publicationOptifab 2003
Subtitle of host publicationTechnical Digest
EditorsHarvey M. Pollicove, Walter C. Czajkowski, Toshihide Dohi, Hans Lauth
PublisherSPIE
Pages125-127
Number of pages3
ISBN (Electronic)9780819451040
DOIs
Publication statusPublished - May 19 2003
EventOptifab 2003: Technical Digest - Rochester, United States
Duration: May 19 2003May 22 2003

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10314
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptifab 2003: Technical Digest
CountryUnited States
CityRochester
Period5/19/035/22/03

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Sternal, J., Shafrir, S. N., Randi, J. A., Gregg, L. L., & Jacobs, S. D. (2003). Refractive index anisotropy in optics using a birefringence mapper. In H. M. Pollicove, W. C. Czajkowski, T. Dohi, & H. Lauth (Eds.), Optifab 2003: Technical Digest (pp. 125-127). [1031417] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10314). SPIE. https://doi.org/10.1117/12.2284032