Relaxor ferroelectricity in strained epitaxial SrTiO 3 thin films on DyScO 3 substrates

M. D. Biegalski, Y. Jia, D. G. Schlom, S. Trolier-Mckinstry, S. K. Streiffer, V. Sherman, R. Uecker, P. Reiche

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Abstract

The ferroelectric properties of 500 Å thick strained, epitaxial SrTi O3 films grown on DySc O3 substrates by reactive molecular-beam epitaxy are reported. Despite the near 1% biaxial tensile strain, the x-ray rocking curve full widths at half maximum in ω are as narrow as 7 arc sec (0.002°). The films show a frequency-dependent permittivity maximum near 250 K that is well fit by the Vogel-Fulcher equation. A clear polarization hysteresis is observed below the permittivity maximum, with an in-plane remanent polarization of 10 μC cm2 at 77 K. The high Tmax is consistent with the biaxial tensile strain state, while the superimposed relaxor behavior is likely due to defects.

Original languageEnglish (US)
Article number192907
JournalApplied Physics Letters
Volume88
Issue number19
DOIs
Publication statusPublished - May 23 2006

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Biegalski, M. D., Jia, Y., Schlom, D. G., Trolier-Mckinstry, S., Streiffer, S. K., Sherman, V., ... Reiche, P. (2006). Relaxor ferroelectricity in strained epitaxial SrTiO 3 thin films on DyScO 3 substrates. Applied Physics Letters, 88(19), [192907]. https://doi.org/10.1063/1.2198088