Reliability-aware design for nanometer-scale devices

David Atienza, Giovanni De Micheli, Luca Benini, José L. Ayala, Pablo G. Del Valle, Michael DeBole, Vijay Narayanan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

25 Citations (Scopus)

Abstract

Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges to maintain manufacturing yield rates and reliable devices in their expected lifetimes for latest nanometer-scale dimensions. In fact, new system and processor microarchitectures require new reliability-aware design methods and exploration tools that can face these challenges without significantly increasing manufacturing cost, reducing system performance or imposing large area overheads due to redundancy. In this paper we overview the latest approaches in reliability modeling and variability-tolerant design for latest technology nodes, and advocate the need of reliability-aware design for forthcoming consumer electronics. Moreover, we illustrate with a case study of an embedded processor that effective reliability-aware design can be achieved in nanometer-scale devices through integral design approaches that covers modeling and exploration of reliability effects, and hardware-software architectural techniques to provide reliability-enhanced solutions at both microarchitectural- and system-level.

Original languageEnglish (US)
Title of host publication2008 Asia and South Pacific Design Automation Conference, ASP-DAC
Pages549-554
Number of pages6
DOIs
StatePublished - Aug 21 2008
Event2008 Asia and South Pacific Design Automation Conference, ASP-DAC - Seoul, Korea, Republic of
Duration: Mar 21 2008Mar 24 2008

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

Other2008 Asia and South Pacific Design Automation Conference, ASP-DAC
CountryKorea, Republic of
CitySeoul
Period3/21/083/24/08

Fingerprint

Consumer electronics
Redundancy
Transistors
Hardware
Costs
Temperature

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

Cite this

Atienza, D., De Micheli, G., Benini, L., Ayala, J. L., Del Valle, P. G., DeBole, M., & Narayanan, V. (2008). Reliability-aware design for nanometer-scale devices. In 2008 Asia and South Pacific Design Automation Conference, ASP-DAC (pp. 549-554). [4484011] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2008.4484011
Atienza, David ; De Micheli, Giovanni ; Benini, Luca ; Ayala, José L. ; Del Valle, Pablo G. ; DeBole, Michael ; Narayanan, Vijay. / Reliability-aware design for nanometer-scale devices. 2008 Asia and South Pacific Design Automation Conference, ASP-DAC. 2008. pp. 549-554 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).
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Atienza, D, De Micheli, G, Benini, L, Ayala, JL, Del Valle, PG, DeBole, M & Narayanan, V 2008, Reliability-aware design for nanometer-scale devices. in 2008 Asia and South Pacific Design Automation Conference, ASP-DAC., 4484011, Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, pp. 549-554, 2008 Asia and South Pacific Design Automation Conference, ASP-DAC, Seoul, Korea, Republic of, 3/21/08. https://doi.org/10.1109/ASPDAC.2008.4484011

Reliability-aware design for nanometer-scale devices. / Atienza, David; De Micheli, Giovanni; Benini, Luca; Ayala, José L.; Del Valle, Pablo G.; DeBole, Michael; Narayanan, Vijay.

2008 Asia and South Pacific Design Automation Conference, ASP-DAC. 2008. p. 549-554 4484011 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Atienza D, De Micheli G, Benini L, Ayala JL, Del Valle PG, DeBole M et al. Reliability-aware design for nanometer-scale devices. In 2008 Asia and South Pacific Design Automation Conference, ASP-DAC. 2008. p. 549-554. 4484011. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2008.4484011