Reliability-centric hardware/software co-design

S. Tosun, N. Mansouri, E. Arvas, M. Kandemir, Y. Xie, W. L. Hung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

23 Scopus citations

Abstract

This paper proposes a reliability-centric hardware/software co-design framework. This framework operates with a component library that provides multiple alternates for a given task, each of which is potentially different from the others in terms of reliability, performance, and area metrics. The paper also presents an experimental evaluation of the proposed co-design framework using several example designs and a comparison to a conventional co-design method that does not consider reliability. Our experimental evaluation demonstrates that the proposed framework can be used to study the tradeoffs between area, performance, and reliability and that it is important to include reliability as a first class parameter in optimization.

Original languageEnglish (US)
Title of host publicationProceedings - 6th International Symposium on Quality Electronic Design, ISQED 2005
Pages375-380
Number of pages6
DOIs
StatePublished - Dec 1 2005
Event6th International Symposium on Quality Electronic Design, ISQED 2005 - San Jose, CA, United States
Duration: Mar 21 2005Mar 23 2005

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Other

Other6th International Symposium on Quality Electronic Design, ISQED 2005
CountryUnited States
CitySan Jose, CA
Period3/21/053/23/05

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Tosun, S., Mansouri, N., Arvas, E., Kandemir, M., Xie, Y., & Hung, W. L. (2005). Reliability-centric hardware/software co-design. In Proceedings - 6th International Symposium on Quality Electronic Design, ISQED 2005 (pp. 375-380). [1410612] (Proceedings - International Symposium on Quality Electronic Design, ISQED). https://doi.org/10.1109/ISQED.2005.104