Reliability of the piezoelectric layer application to vibration and noise controls

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

In this Tech Brief, the local curvature induced peeling tensile stress within the piezoactuator patch is qualitatively estimated, and the detailed stress analysis for an ACLD beam is conducted to show the high stresses concentration at the edges of a piezoactuator patch.

Original languageEnglish (US)
Pages (from-to)137-139
Number of pages3
JournalJournal of Vibration and Acoustics, Transactions of the ASME
Volume121
Issue number1
DOIs
StatePublished - Jan 1 1999

Fingerprint

Acoustic variables control
Peeling
piezoelectric actuators
Vibration control
Stress analysis
Tensile stress
Stress concentration
vibration
peeling
stress analysis
stress concentration
tensile stress
curvature

All Science Journal Classification (ASJC) codes

  • Acoustics and Ultrasonics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

@article{ce811eb6105d4bf183a6683ff30b5cfa,
title = "Reliability of the piezoelectric layer application to vibration and noise controls",
abstract = "In this Tech Brief, the local curvature induced peeling tensile stress within the piezoactuator patch is qualitatively estimated, and the detailed stress analysis for an ACLD beam is conducted to show the high stresses concentration at the edges of a piezoactuator patch.",
author = "U. Lee and Lesieutre, {George A.}",
year = "1999",
month = "1",
day = "1",
doi = "10.1115/1.2893941",
language = "English (US)",
volume = "121",
pages = "137--139",
journal = "Journal of Vibration and Acoustics, Transactions of the ASME",
issn = "1048-9002",
publisher = "American Society of Mechanical Engineers(ASME)",
number = "1",

}

TY - JOUR

T1 - Reliability of the piezoelectric layer application to vibration and noise controls

AU - Lee, U.

AU - Lesieutre, George A.

PY - 1999/1/1

Y1 - 1999/1/1

N2 - In this Tech Brief, the local curvature induced peeling tensile stress within the piezoactuator patch is qualitatively estimated, and the detailed stress analysis for an ACLD beam is conducted to show the high stresses concentration at the edges of a piezoactuator patch.

AB - In this Tech Brief, the local curvature induced peeling tensile stress within the piezoactuator patch is qualitatively estimated, and the detailed stress analysis for an ACLD beam is conducted to show the high stresses concentration at the edges of a piezoactuator patch.

UR - http://www.scopus.com/inward/record.url?scp=0032761818&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032761818&partnerID=8YFLogxK

U2 - 10.1115/1.2893941

DO - 10.1115/1.2893941

M3 - Article

VL - 121

SP - 137

EP - 139

JO - Journal of Vibration and Acoustics, Transactions of the ASME

JF - Journal of Vibration and Acoustics, Transactions of the ASME

SN - 1048-9002

IS - 1

ER -