Results from the Extended X-ray Off-plane Spectrometer (EXOS) sounding rocket payload

Phil Oakley, Ben Zeiger, Michael Kaiser, Ann Shipley, Webster Cash, Randall Lee McEntaffer, Ted Schultz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

We present results from the Extended X-ray Off-Plane Spectrometer (EXOS) sounding rocket payload. The payload was launched on November 13, 2009 and successfully obtained a spectrum of the Cygnus Loop Supernova Remnant. The instrument observed in the ∼20-110 Angstrom bandpass with high resolution (∼50) by utilizing an offplane reflection grating array. This payload is also the 2nd flight for a relatively new type of detector, the Gaseous Electron Multiplier (GEM) detector. We discuss the performance of these technologies in flight, as well as an overview of our plans for the next flight of this design.

Original languageEnglish (US)
Title of host publicationSpace Telescopes and Instrumentation 2010
Subtitle of host publicationUltraviolet to Gamma Ray
DOIs
Publication statusPublished - Oct 19 2010
EventSpace Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray - San Diego, CA, United States
Duration: Jun 28 2010Jul 2 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7732
ISSN (Print)0277-786X

Other

OtherSpace Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray
CountryUnited States
CitySan Diego, CA
Period6/28/107/2/10

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Oakley, P., Zeiger, B., Kaiser, M., Shipley, A., Cash, W., McEntaffer, R. L., & Schultz, T. (2010). Results from the Extended X-ray Off-plane Spectrometer (EXOS) sounding rocket payload. In Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray [77321R] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7732). https://doi.org/10.1117/12.857540