Retardance of chalcogenide thin films grown by the oblique-angle-deposition technique

Raúl J. Martín-Palma, Fan Zhang, Akhlesh Lakhtakia, An Cheng, Jian Xu, Carlo G. Pantano

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Columnar and chevronic thin films of GeSbSe chalcogenide glasses were grown by the oblique-angle-deposition technique. These thin films were found to exhibit dielectric anisotropy in the near-infrared regime. The retardance of any of the fabricated thin films was found to increase linearly with the thickness. Columnar thin films exhibited significantly lower retardance per unit thickness than chevronic thin films. The experimental results indicate the potential of these thin films for near-infrared polarizers.

Original languageEnglish (US)
Pages (from-to)5553-5556
Number of pages4
JournalThin Solid Films
Volume517
Issue number18
DOIs
StatePublished - Jul 31 2009

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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