RFId application challenges and risk analysis

Xiao Dan Wu, Yun Feng Wang, Jun Bo Bai, Hai Yan Wang, Chao Hsien Chu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

RFID application becomes the focus recently. As an automatic identification technology, RFID has many advantages over traditional one like barcode. It does bring about tremendous changes, and also face lots of barriers during investment. In this paper, we integrate technology risk, IT risk and RFID risk, develop a RFID risk factor framework with analogy method, and find out the relationship between RFID uncertainty and RFID risk. Subjective Scoring Method is adopted to assess RFID risk level. Finally, RFID risk management methods for different kinds of risks are provided.

Original languageEnglish (US)
Title of host publicationProceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010
Pages1086-1090
Number of pages5
DOIs
StatePublished - Dec 31 2010
Event17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010 - Xiamen, China
Duration: Oct 29 2010Oct 31 2010

Other

Other17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010
CountryChina
CityXiamen
Period10/29/1010/31/10

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering

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  • Cite this

    Wu, X. D., Wang, Y. F., Bai, J. B., Wang, H. Y., & Chu, C. H. (2010). RFId application challenges and risk analysis. In Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010 (pp. 1086-1090). [5646426] https://doi.org/10.1109/ICIEEM.2010.5646426