Rietveld analysis using a laboratory-based high pressure x-ray diffraction system and film-based detection

Masashi Hasegawa, John V. Badding

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Rietveld structure refinement using a laboratory-based high pressure x-ray diffraction system described previously and film-based detection is reported. Although there is currently much emphasis on the use of synchrotron radiation and advanced detectors such as imaging plates and position-sensitive detectors for collection of high pressure diffraction data suitable for Rietveld analysis, the results presented here demonstrate that excellent refinements can be performed on data collected at low cost in the laboratory with film-based detection. The diffraction system exhibits an instrumental profile suitable for Rietveld analysis, exhibiting no asymmetry and narrow linewidths.

Original languageEnglish (US)
Pages (from-to)2298-2300
Number of pages3
JournalReview of Scientific Instruments
Volume68
Issue number6
DOIs
StatePublished - Jun 1997

All Science Journal Classification (ASJC) codes

  • Instrumentation

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