Role of low-level impurities and intercalated molecular gases in the α particle radiolysis of polytetrafluoroethylene examined by static time-of-flight secondary-ion-mass spectrometery

Gregory L. Fisher, Christopher Szakal, Christopher J. Wetteland, Nicholas Winograd

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The structural degradation of polytetrafluoroethylene (PTFE) upon irradiation with MeV alpha (α) particles is accompanied by the proliferation of hydrogenated and oxygen-functionalized fluorocarbon species. In this article, we explore the origin of monoxide- and dioxide-functionalized fluorocarbon species that emerge upon α particle irradiation of PTFE. Samples of neat PTFE were irradiated to α doses in the range of 107 -5× 1010 rad using 5.5 MeV He 2+ 4 ions produced in a tandem accelerator. Static time-of-flight secondary-ion-mass spectrometry (TOF-SIMS), using a 20 keV C60+ source, was employed to probe chemical changes as a function of α particle irradiation. Chemical images and high-resolution mass spectra were collected in both the positive and negative polarities. Residual gas analysis, utilized to monitor the liberation of molecular gases during α particle irradiation of the PTFE in vacuum, is discussed in relationship to the TOF-SIMS data.

Original languageEnglish (US)
Article number017604JVA
Pages (from-to)1166-1171
Number of pages6
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume24
Issue number4
DOIs
StatePublished - Jul 1 2006

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Radiolysis
polytetrafluoroethylene
Polytetrafluoroethylene
molecular gases
radiolysis
Polytetrafluoroethylenes
Gases
Irradiation
Impurities
Ions
Fluorocarbons
impurities
irradiation
fluorocarbons
Secondary ion mass spectrometry
secondary ion mass spectrometry
ions
Gas fuel analysis
gas analysis
Alpha particles

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

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title = "Role of low-level impurities and intercalated molecular gases in the α particle radiolysis of polytetrafluoroethylene examined by static time-of-flight secondary-ion-mass spectrometery",
abstract = "The structural degradation of polytetrafluoroethylene (PTFE) upon irradiation with MeV alpha (α) particles is accompanied by the proliferation of hydrogenated and oxygen-functionalized fluorocarbon species. In this article, we explore the origin of monoxide- and dioxide-functionalized fluorocarbon species that emerge upon α particle irradiation of PTFE. Samples of neat PTFE were irradiated to α doses in the range of 107 -5× 1010 rad using 5.5 MeV He 2+ 4 ions produced in a tandem accelerator. Static time-of-flight secondary-ion-mass spectrometry (TOF-SIMS), using a 20 keV C60+ source, was employed to probe chemical changes as a function of α particle irradiation. Chemical images and high-resolution mass spectra were collected in both the positive and negative polarities. Residual gas analysis, utilized to monitor the liberation of molecular gases during α particle irradiation of the PTFE in vacuum, is discussed in relationship to the TOF-SIMS data.",
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AU - Szakal, Christopher

AU - Wetteland, Christopher J.

AU - Winograd, Nicholas

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N2 - The structural degradation of polytetrafluoroethylene (PTFE) upon irradiation with MeV alpha (α) particles is accompanied by the proliferation of hydrogenated and oxygen-functionalized fluorocarbon species. In this article, we explore the origin of monoxide- and dioxide-functionalized fluorocarbon species that emerge upon α particle irradiation of PTFE. Samples of neat PTFE were irradiated to α doses in the range of 107 -5× 1010 rad using 5.5 MeV He 2+ 4 ions produced in a tandem accelerator. Static time-of-flight secondary-ion-mass spectrometry (TOF-SIMS), using a 20 keV C60+ source, was employed to probe chemical changes as a function of α particle irradiation. Chemical images and high-resolution mass spectra were collected in both the positive and negative polarities. Residual gas analysis, utilized to monitor the liberation of molecular gases during α particle irradiation of the PTFE in vacuum, is discussed in relationship to the TOF-SIMS data.

AB - The structural degradation of polytetrafluoroethylene (PTFE) upon irradiation with MeV alpha (α) particles is accompanied by the proliferation of hydrogenated and oxygen-functionalized fluorocarbon species. In this article, we explore the origin of monoxide- and dioxide-functionalized fluorocarbon species that emerge upon α particle irradiation of PTFE. Samples of neat PTFE were irradiated to α doses in the range of 107 -5× 1010 rad using 5.5 MeV He 2+ 4 ions produced in a tandem accelerator. Static time-of-flight secondary-ion-mass spectrometry (TOF-SIMS), using a 20 keV C60+ source, was employed to probe chemical changes as a function of α particle irradiation. Chemical images and high-resolution mass spectra were collected in both the positive and negative polarities. Residual gas analysis, utilized to monitor the liberation of molecular gases during α particle irradiation of the PTFE in vacuum, is discussed in relationship to the TOF-SIMS data.

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