Role of low-level impurities and intercalated molecular gases in the α particle radiolysis of polytetrafluoroethylene examined by static time-of-flight secondary-ion-mass spectrometery

Gregory L. Fisher, Christopher Szakal, Christopher J. Wetteland, Nicholas Winograd

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The structural degradation of polytetrafluoroethylene (PTFE) upon irradiation with MeV alpha (α) particles is accompanied by the proliferation of hydrogenated and oxygen-functionalized fluorocarbon species. In this article, we explore the origin of monoxide- and dioxide-functionalized fluorocarbon species that emerge upon α particle irradiation of PTFE. Samples of neat PTFE were irradiated to α doses in the range of 107 -5× 1010 rad using 5.5 MeV He 2+ 4 ions produced in a tandem accelerator. Static time-of-flight secondary-ion-mass spectrometry (TOF-SIMS), using a 20 keV C60+ source, was employed to probe chemical changes as a function of α particle irradiation. Chemical images and high-resolution mass spectra were collected in both the positive and negative polarities. Residual gas analysis, utilized to monitor the liberation of molecular gases during α particle irradiation of the PTFE in vacuum, is discussed in relationship to the TOF-SIMS data.

Original languageEnglish (US)
Article number017604JVA
Pages (from-to)1166-1171
Number of pages6
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume24
Issue number4
DOIs
StatePublished - Jul 1 2006

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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