Run length analysis of Shewhart charts applied to drifting processes under an integrative SPC/EPC model

Rainer Göb, Enrique Del Castillo, Klaus Dräger

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Engineering Process Controllers (EPC) are frequently based on parametrized models. If process conditions change, the parameter estimates used by the controllers may become biased, and the quality characteristics will be affected. To detect such changes it is adequate to use Statistical Process Control (SPC) methods. The run length statistic is commonly used to describe the performance of an SPC chart. This paper develops approximations for the first two moments of the run length distribution of a one-sided Shewhart chart used to detect two types of process changes in a system that is regulated by a given EPC scheme: i) changes in the level parameter; ii) changes in the drift parameter. If the drift parameter shifts, it is further assumed that the form of the drift process changes from a linear trend under white noise (the in-control drift model) into a random walk with drift model. Two different approximations for the run length moments are presented and their accuracy is numerically analyzed.

Original languageEnglish (US)
Pages (from-to)137-161
Number of pages25
JournalMetrika
Volume50
Issue number2
DOIs
StatePublished - 1999

All Science Journal Classification (ASJC) codes

  • Statistics and Probability
  • Statistics, Probability and Uncertainty

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